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1

Performance analysis of demand planning approaches for aggregating, forecasting and disaggregating interrelated demands

Argon Chen, Jakey Blue

Journal:

International Journal of Production Economics

Year:

2010

Language:

english

File:

PDF, 2.48 MB

english, 2010

2

[IEEE 2000 Semiconductor Manufacturing Technology Workshop - Hsinchu, Taiwan (14-15 June 2000)] 2000 Semiconductor Manufacturing Technology Workshop (Cat. No.00EX406) - Run-to-run control schemes for CMP process subject to deterministic drifts

Ruey-Shan Guo,, Argon Chen,, Jin-Jung Chen,

Year:

2000

Language:

english

File:

PDF, 581 KB

english, 2000

3

Automatic BI-RADS Diagnosis of Breast Lesions by CAD (Computer-Aid Diagnosis)

Kuo, Wen-Hung, Chuang, Shu-Chuan, Yang, Shou-Huan, Yung-Lung, Ku, Chen, Argon, Chang, King-Jen

Journal:

Ultrasound in Medicine & Biology

Year:

2013

Language:

english

File:

PDF, 45 KB

english, 2013

4

Efficient simulation budget allocation with regression

Brantley, Mark W., Lee, Loo Hay, Chen, Chun-Hung, Chen, Argon

Journal:

IIE Transactions

Year:

2013

Language:

english

File:

PDF, 590 KB

english, 2013

5

[IEEE 1997 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings - San Francisco, CA, USA (6-8 Oct. 1997)] 1997 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat. No.97CH36023) - A cost-effective methodology for a run-by-run EWMA controller

Ruey-Shan Guo,, Li-Shia Huang,, Argon chen,, Jin-Jung Chen,

Year:

1997

Language:

english

File:

PDF, 356 KB

english, 1997

6

Demand planning approaches to aggregating and forecasting interrelated demands for safety stock and backup capacity planning

Chen, Argon, Hsu, C.-H., Blue, J.

Journal:

International Journal of Production Research

Year:

2007

Language:

english

File:

PDF, 612 KB

english, 2007

7

Efficient Splitting Simulation for Blackout Analysis

Wang, Sing-Po, Chen, Argon, Liu, Chih-Wen, Chen, Chun-Hung, Shortle, John, Wu, Jin-Yi

Journal:

IEEE Transactions on Power Systems

Year:

2015

Language:

english

File:

PDF, 1.43 MB

english, 2015

8

Optimal supply chain configurations in semiconductor manufacturing

Chiang, David, Guo, Ruey-Shan, Chen, Argon, Cheng, Meng-Tse, Chen, Cheng-Bang

Journal:

International Journal of Production Research

Year:

2007

Language:

english

File:

PDF, 429 KB

english, 2007

9

Grain boundary and interphase boundary sliding in power law creep

I.W. Chen, A.S. Argon

Journal:

Acta Metallurgica

Year:

1979

Language:

english

File:

PDF, 731 KB

english, 1979

10

Steady state power-law creep in heterogeneous alloys with coarse microstructures

I.W. Chen, A.S. Argon

Journal:

Acta Metallurgica

Year:

1979

Language:

english

File:

PDF, 787 KB

english, 1979

11

Diffusive growth of grain-boundary cavities

I-W. Chen, A.S. Argon

Journal:

Acta Metallurgica

Year:

1981

Language:

english

File:

PDF, 1.07 MB

english, 1981

12

Computerized Detection and Quantification of Microcalcifications in Thyroid Nodules

Kuen-Yuan Chen, Chiung-Nien Chen, Ming-Hsun Wu, Ming-Chih Ho, Hao-Chih Tai, Wen-Chang Huang, Yuan-Chang Chung, Argon Chen, King-Jen Chang

Journal:

Ultrasound in Medicine & Biology

Year:

2011

Language:

english

File:

PDF, 617 KB

english, 2011

13

Creep cavitation in 304 stainless steel

I-W. Chen, A.S. Argon

Journal:

Acta Metallurgica

Year:

1981

File:

PDF, 1.46 MB

1981

14

Intergranular cavitation during creep in astroloy

Capano, M.A., Argon, A.S., Chen, I-W.

Journal:

Acta Metallurgica

Year:

1989

Language:

english

File:

PDF, 1.01 MB

english, 1989

15

Test of covariance changes without a large sample and its application to fault detection and classification

Hung Hung, Argon Chen

Journal:

Journal of Process Control

Year:

2012

Language:

english

File:

PDF, 1.40 MB

english, 2012

16

[IEEE Energy Society General Meeting - Detroit, MI, USA (2011.07.24-2011.07.29)] 2011 IEEE Power and Energy Society General Meeting - Rare-event splitting simulation for analysis of power system blackouts

Wang, Sing-Po, Chen, Argon, Liu, Chih-Wen, Chen, Chun-Hung, Shortle, John

Year:

2011

Language:

english

File:

PDF, 1.16 MB

english, 2011

17

Piecewise regression model construction with sample efficient regression tree (SERT) and applications to semiconductor yield analysis

Amos Hong, Argon Chen

Journal:

Journal of Process Control

Year:

2012

Language:

english

File:

PDF, 928 KB

english, 2012

18

Sample-Efficient Regression Trees (SERT) for Semiconductor Yield Loss Analysis

Argon Chen, Hong, A.

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2010

Language:

english

File:

PDF, 2.21 MB

english, 2010

19

[IEEE 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings - Santa Clara, CA, USA (11-13 Oct. 1999)] 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat No.99CH36314) - Run-to-run control of CMP process considering aging effects of pad and disc

Argon Chen,, Ruey-Shan Guo,, Chou, Y.L., Lin, C.L., Jowei Dun,, Wu, S.A.

Year:

1999

Language:

english

File:

PDF, 233 KB

english, 1999

20

Quantitative Analysis of Dynamic Power Doppler Sonograms for Patients with Thyroid Nodules

Wu, Ming-Hsun, Chen, Chiung-Nien, Chen, Kuen-Yuan, Ho, Ming-Chih, Tai, Hao-Chih, Chung, Yuan-Chang, Lo, Chan-Peng, Chen, Argon, Chang, King-Jen

Journal:

Ultrasound in Medicine & Biology

Year:

2013

Language:

english

File:

PDF, 1.59 MB

english, 2013

21

Design and Performance Analysis of the Exponentially Weighted Moving Average Mean Estimate for Processes Subject to Random Step Changes

Argon Chen and E. A. Elsayed

Journal:

Year:

2002

Language:

english

File:

PDF, 1.41 MB

english, 2002

22

[IEEE 2000 Semiconductor Manufacturing Technology Workshop - Hsinchu, Taiwan (14-15 June 2000)] 2000 Semiconductor Manufacturing Technology Workshop (Cat. No.00EX406) - An effective SPC approach to monitoring semiconductor quality data with multiple variation sources

Argon Chen,, Ruey-Shan Guo,, Pei-Chen Yeh,

Year:

2000

Language:

english

File:

PDF, 253 KB

english, 2000

23

[IEEE 2006 International Symposium on Semiconductor Manufacturing (ISSM) - Tokyo, Japan (2006.09.25-2006.09.27)] 2006 IEEE International Symposium on Semiconductor Manufacturing - A Quadratic Goal Programming Model and Sensitivity Analysis for Semiconductor Supply Chain

Chiang, David, Guo, Ruey-Shan, Chen, Argon, Chen, Cheng-Bang

Year:

2006

Language:

english

File:

PDF, 1.87 MB

english, 2006

24

Computerized Quantification of Ultrasonic Heterogeneity in Thyroid Nodules

Chen, Kuen-Yuan, Chen, Chiung-Nien, Wu, Ming-Hsun, Ho, Ming-Chih, Tai, Hao-Chih, Kuo, Wen-Hong, Huang, Wen-Chang, Wang, Yu-Hsin, Chen, Argon, Chang, King-Jen

Journal:

Ultrasound in Medicine & Biology

Year:

2014

Language:

english

File:

PDF, 1.18 MB

english, 2014

25

Weighted least-square estimation of demand product mix and its applications to semiconductor demand

Chen, Argon, Yang, Kyle, Hsia, Ziv

Journal:

International Journal of Production Research

Year:

2008

Language:

english

File:

PDF, 763 KB

english, 2008

26

[IEEE 2009 IEEE International Conference on Automation Science and Engineering (CASE 2009) - Bangalore, India (2009.08.22-2009.08.25)] 2009 IEEE International Conference on Automation Science and Engineering - Optimum sampling for track PEB CD Integrated Metrology

Chen, Argon, Hsueh, Sean, Blue, Jakey

Year:

2009

Language:

english

File:

PDF, 629 KB

english, 2009

27

[IEEE 2007 International Symposium on Semiconductor Manufacturing - Santa Clara, CA, USA (2007.10.15-2007.10.17)] 2007 International Symposium on Semiconductor Manufacturing - Statistical multi-objective optimization and its application to IC layout design for E-Tests

Chen, Argon, Chen, Vic, Hsu, Chris

Year:

2007

Language:

english

File:

PDF, 1.85 MB

english, 2007

28

[IEEE 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings - Santa Clara, CA, USA (11-13 Oct. 1999)] 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat No.99CH36314) - Function-based cost modeling for wafer manufacturing and its application to strategic management

Ruey-Shan Guo,, Argon Chen,, Pei-Lan Lin,, Yih-Cheng Shih,

Year:

1999

Language:

english

File:

PDF, 281 KB

english, 1999

29

[IEEE 2009 First International Conference on Advances in System Simulation (SIMUL) - Porto, Portugal (2009.09.20-2009.09.25)] 2009 First International Conference on Advances in System Simulation - Priority Cycle Time Behavior Modeling for Semiconductor Fabs

Chang, Shi-Chung, Liao, Bo-Jiun, Kao, Yu-Ting, Chen, Argon

Year:

2009

Language:

english

File:

PDF, 397 KB

english, 2009

30

[IEEE 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings - Santa Clara, CA, USA (11-13 Oct. 1999)] 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat No.99CH36314) - Modeling and optimization of wafer-level spatial uniformity with the use of rational subgrouping

Ruey-Shan Guo,, Argon Chen,, Cheewee Liu,, Lin, A., Lan, M.

Year:

1999

Language:

english

File:

PDF, 301 KB

english, 1999

31

Design and Performance Analysis of the Exponentially Weighted Moving Average Mean Estimate for Processes Subject to Random Step Changes

Chen, Argon, Elsayed, E A

Journal:

Year:

2002

Language:

english

File:

PDF, 807 KB

english, 2002

32

Spatial Variance Spectrum Analysis and Its Application to Unsupervised Detection of Systematic Wafer Spatial Variations

Blue, Jakey, Chen, Argon

Journal:

IEEE Transactions on Automation Science and Engineering

Year:

2011

Language:

english

File:

PDF, 1.42 MB

english, 2011

33

[IEEE 2006 International Symposium on Semiconductor Manufacturing (ISSM) - Tokyo, Japan (2006.09.25-2006.09.27)] 2006 IEEE International Symposium on Semiconductor Manufacturing - Recipe-independent Tool Health Indicator and Fault Prognosis

Chen, Argon, Blue, Jakey, Chou, Tze-Chin, Yang, Tsu-Kuang

Year:

2006

Language:

english

File:

PDF, 1.30 MB

english, 2006

34

A PRODUCIBILITY MEASURE FOR QUALITY CHARACTERISTICS WITH DESIGN SPECIFICATIONS

Byun, Jai-Hyun, Elsayed, Elsayed A., Chen, Argon C. K., Bruins, Rieks

Journal:

Quality Engineering

Year:

1997

Language:

english

File:

PDF, 180 KB

english, 1997

35

Real-time health prognosis and dynamic preventive maintenance policy for equipment under aging Markovian deterioration

Chen, Argon, Wu, G. S.

Journal:

International Journal of Production Research

Year:

2007

Language:

english

File:

PDF, 1.88 MB

english, 2007

36

[IEEE 2003 IEEE International Symposium on Semiconductor Manufacturing. - San Jose, CA, USA (30 Sept.-2 Oct. 2003)] 2003 5th International Conference on ASIC. Proceedings (IEEE Cat. No.03TH8690) - Semiconductor product-mix estimate with dynamic weighting scheme

Argon Chen,, Ziv Hsia,, Kyle Yang,

Year:

2003

Language:

english

File:

PDF, 247 KB

english, 2003

37

[IEEE 2008 IEEE International Conference on Automation Science and Engineering (CASE 2008) - Arlington, VA (2008.08.23-2008.08.26)] 2008 IEEE International Conference on Automation Science and Engineering - Optimal sampling in design of experiment for simulation-based stochastic optimization

Brantley, Mark W., Lee, Loo H., Chun-Hung Chen,, Chen, Argon

Year:

2008

Language:

english

File:

PDF, 265 KB

english, 2008

38

[IEEE Industrial Engineering (CIE39) - Troyes, France (2009.07.6-2009.07.9)] 2009 International Conference on Computers & Industrial Engineering - Analysis of microarray data with multiple phenotypes

Year:

2009

Language:

english

File:

PDF, 1.62 MB

english, 2009

39

[IEEE 2012 Winter Simulation Conference - (WSC 2012) - Berlin, Germany (2012.12.9-2012.12.12)] Proceedings Title: Proceedings of the 2012 Winter Simulation Conference (WSC) - Dominance index for many-to-many correlation and its applicaions to semiconductor yield analysis

Hong, Amos, Chen, Argon

Year:

2012

Language:

english

File:

PDF, 317 KB

english, 2012

40

[IEEE 2006 International Symposium on Semiconductor Manufacturing (ISSM) - Tokyo, Japan (2006.09.25-2006.09.27)] 2006 IEEE International Symposium on Semiconductor Manufacturing - Priority Behavior Modeling of Fab for Supply Chain Management

Chang, Shi-Chung, Liao, Bo-Jiun, Chen, Argon

Year:

2006

Language:

english

File:

PDF, 1.26 MB

english, 2006

41

[IEEE 2006 International Symposium on Semiconductor Manufacturing (ISSM) - Tokyo, Japan (2006.09.25-2006.09.27)] 2006 IEEE International Symposium on Semiconductor Manufacturing - Sample Efficient Regression Trees (SERT) for Yield Loss Analysis

Chen, Argon, Hong, Amos, Ho, Odey, Liu, Chao-Wen, Huang, Yi-His

Year:

2006

Language:

english

File:

PDF, 2.88 MB

english, 2006

42

Applications of quantitative methods in semiconductor manufacturing

Mönch, Lars, Chen, Argon, Ham, Andy (Myoungsoo), Morrison, James

Journal:

Computers & Operations Research

Year:

2015

Language:

english

File:

PDF, 142 KB

english, 2015

43

[IEEE 2014 IEEE International Conference on Automation Science and Engineering (CASE) - Taipei (2014.8.18-2014.8.22)] 2014 IEEE International Conference on Automation Science and Engineering (CASE) - A variance-reduction method for thyroid nodule boundary detection on ultrasound images

Chiu, Ling-Ying, Chen, Argon

Year:

2014

Language:

english

File:

PDF, 937 KB

english, 2014

44

Design of EWMA and CUSUM control charts subject to random shift sizes and quality impacts

Chen, Argon, Chen, Y. K.

Journal:

IIE Transactions

Year:

2007

Language:

english

File:

PDF, 450 KB

english, 2007

45

An alternative mean estimator for processes monitored by SPC charts

Chen, Argon, Elsayed, E.A.

Journal:

International Journal of Production Research

Year:

2000

File:

PDF, 573 KB

2000

46

An alternative mean estimator for processes monitored by SPC charts

Chen, Argon, Elsayed, E.A.

Journal:

International Journal of Production Research

Year:

2000

Language:

english

File:

PDF, 573 KB

english, 2000

47

Optimal levels of process parameters for products with multiple characteristics

ELSAYED, E. A., CHEN, ARGON

Journal:

International Journal of Production Research

Year:

1993

Language:

english

File:

PDF, 733 KB

english, 1993

48

SPIE Proceedings [SPIE SPIE BiOS - San Francisco, California, USA (Saturday 2 February 2013)] Imaging, Manipulation, and Analysis of Biomolecules, Cells, and Tissues XI - Determining the influence of age and diabetes on the second-harmonic generation strength of dermal collagen fibers in vivo by using electronic noises

Hung, Wei-Chun, Farkas, Daniel L., Nicolau, Dan V., Sun, Chi-Kuang, Chen, Argon, Leif, Robert C.

Year:

2013

Language:

english

File:

PDF, 630 KB

english, 2013

49

A self‐tuning run‐by‐run process controller for processes subject to random disturbances

Guo, Ruey‐Shan, Chen, Jin‐Jung, Chen, Argon, Lu, Shui‐Shong

Journal:

Journal of the Chinese Institute of Engineers

Year:

1999

Language:

english

File:

PDF, 1.09 MB

english, 1999

50

AN ALTERNATIVE DYNAMIC PROGRAMMING APPROACH TO ALLOCATING INSPECTION POINTS IN MULTISTAGE PRODUCTION SYSTEMS

Journal:

Quality Engineering

Year:

1998

Language:

english

File:

PDF, 363 KB

english, 1998